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مشخصات فنی اسپکتروفتومتر UV-Visمدل هایSolidSpec-3700DUV و SolidSpec-3700
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محدوده طول موج اسپکتروفتومتر UV-Vis
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Solidspec-3700 Standard model 240 nm to 2600 nm, 190 nm to 3300 nm
(when using Direct Detection Unit DDU)
Solidspec-3700DUV Deep UV model 175 nm to 2600 nm, 165 nm to 3300 nm
(when using Direct Detection Unit DDU-DUV)
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پهنای باند طیف اسپکترومتر UV-Vis
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8 steps in ultraviolet and visible region: 0.1, 0.2, 0.5, 1, 2, 3, 5, 8 nm
10 steps in near-infrared region: 0.2, 0.5, 1, 2, 3, 5, 8, 12, 20, 32 nm
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رزولوشن اسپکتروسکوپی UV-Vis
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0.1 nm
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نمایش طول موج اسپکتروفتومتر UV-Vis
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0.01 nm display
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دقت طول موج اسپکترومتر UV-Vis
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±0.2 nm in ultraviolet and visible region
±0.8 nm in near-infrared region
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تکرار پذیری طول موج طیف سنج UV-Vis
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within ±0.08 nm in ultraviolet and visible region
within ±0.32 nm in near-infrared region
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سرعت اسکن طول موج طیف سنج مرئی - فرابنفش
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Wavelength setting by
About 18,000 nm/min in ultraviolet and visible region
About 70,000 nm/min in near-infrared region ·
Wavelength scanning by
Maximum 4,500 nm/min for ultraviolet and visible region,
Maximum about 9,000 nm/min for near-infrared PMT and InGaAs,
Maximum about 4,000 nm/min for near-infrared PbS
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سوئیچینگ منابع نور اسپکتروفتومتر UV-Vis
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The light sources are switched automatically in conjunction with wavelength scanning.
The wavelength at which the light source is switched in the range of 282 nm to 393 nm in 0.1nm increments.
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پراش نور اسپکترومتر UV-Vis
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Less than 0.00008% (220 nm, NaI)
Less than 0.00005% (340 nm, NaNO2)
Less than 0.0005% (1420 nm, H2O)
Less than 0.005% (2365 nm, CHCl3)
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سیستم فتومتریک اسپکتروسکوپی UV-Vis
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Double beam, direct ratio measuring system
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محدوده فتومتریک اسپکتروفتومتر UV-Vis
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6- to 6 Abs
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دقت فتومتریک اسپکترومتر UV-Vis
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±0.003 Abs(1 Abs),
±0.002 Abs(0.5Abs)
determined with NIST 930D standard filter
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تکرارپذیری طول موج طیف سنجی مرئی - ماوراءبنفش
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0.001 Abs (0 to 0.5 Abs), 0.002 Abs (0.5 to 1 Abs) determined under conditions of 1 second accumulation and maximum deviation for five times measurements
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نویز اسپکترومتر UV-Vis
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Under 0.0002 Abs (500 nm, SBW 8 nm), Under 0.00005 Abs (1500 nm, SBW 8 nm) determined under conditions of RMS value at 0 Abs and 1 second response
When using the Direct Detection Unit DDU/DDU-DUV,
under 0.00005 Abs (500 nm, SBW 2 nm),
under 0.00008 Abs (900 nm, SBW 2 nm),
under 0.00003 Abs (1500 nm, SBW 2 nm)
determined under conditions of RMS value at 0 Abs and 1 second response.
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بیس لاین اسپکتروفتومتر UV-Vis
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±0.003 Abs (240 to 350 nm, SBW 8 nm)
±0.002 Abs (350 to 1600 nm,
Visible region: SBW 8 nm, Near-infrared region: SBW 20 nm)
±0.004 Abs (1600 to 2600 nm, SBW 20 nm)
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دریفت اسپکتروسکوپی UV-Vis
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SolidSpec-3700DUV: Within 0.0002 Abs/h
(after 2 hours warm-up, 500 nm, 1 second accumulation)
SolidSpec-3700DUV: Within 0.0003 Abs/h
(after 2 hours warm-up, 500 nm, 1 second accumulation
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منبع نور اسپکتروفتومتر UV-Vis
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50 W halogen lamp (2000 hours life), Deuterium lamp
(socket type, 1250 hours life for SolidSpec-3700, 300 hours life for SolidSpec-3700DUV)
The automatic position alignment is used for maximum sensitivity
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منوکروماتور اسپکترومتر UV-Vis
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Grating - grating type monochromator
Pre-monochromator: Concave diffraction monochromator
(2 switchable diffraction gratings)
Main monochromator: Czerny-Turner mounting
(2 switchable diffraction gratings)
High-performance blazed holographic grating in aberration-corrected
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آشکارساز اسپکتروسکوپی UV-Vis
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Ultraviolet and visible region: R-928 (SolidSpec-3700), R-955 (SolidSpec-3700DUV)
Near-infrared region: InGaAs and cooled PbS cell for both
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محفظه نمونه طیف سنجی UV-Vis
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Inside dimensions: 900W × 700D × 350H (mm)
Maximum sample size: 700W × 560D × 40H (mm)
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ابعاد طیف سنجی مرئی - فرابنفش
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1000W × 800D × 1200H (mm) (Not including the protruding portions), 170Kg
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دمای محیط اسپکتروفتومتر UV-Vis
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15 to 35 degrees centigrade
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رطوبت محیط اسپکترومتر UV-Vis
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35 to 80% (at room temperature 15 to 30 degrees centigrade),
35 to 70% (at room temperature 30 to 35 degrees centigrade) No condensation
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برق مصرفی اسپکتروسکوپی UV-Vis
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AC 100 V/120 V/220 V/230 V/240 V, 50/60 Hz 300 VA (note2)
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